Food and Fermentation Industries

Effect of mechanical damage on dielectric properties of litchi

  • CHEN Yan ,
  • TAN Jian-hao ,
  • XIANG He-ping ,
  • ZOU Xiang-jun ,
  • LI Bo ,
  • JIANG Zhi-lin
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Online published: 2014-04-25

Abstract

The litchi electrical parameters testing system was designed to test litchi microstructure damage. Five electrical parameters such as complex impedance( Z),parallel equivalent inductance( Lp),parallel equivalent capacitance( Cp),parallel equivalent resistance( Rp) and quality factor( Q) were measured at ten frequencies to explore the possibility of determining micro-damage of litchi. The results indicated that all electrical parameters decreased with increasing frequency except quality factor. In addition,electrical parameters of litchi between the damage and the control were significantly different at certain frequencies. The best electrical parameters frequency to distinguish the damage was 0. 8 kHz.

Cite this article

CHEN Yan , TAN Jian-hao , XIANG He-ping , ZOU Xiang-jun , LI Bo , JIANG Zhi-lin . Effect of mechanical damage on dielectric properties of litchi[J]. Food and Fermentation Industries, 2014 , 40(04) : 47 -50 . DOI: 10.13995/j.cnki.11-1802/ts.2014.04.024

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